Established in 1995, Guanghi Optical Instrument Co., Ltd. is a joint stock China scanning tunneling microscope manufactuer and designer engaged in the manufacturing and marketing of a wide variety of Optical Instrument and products. Our products are widely applied in the education of students, research in lab, entertainment and science explore. During more than one decade's development, our products have awarded the CE certificate. We also have our own quality control system and customer' service system. So we can accept the order against customers' samples, specifying designs, specifications, and packaging requirements. We also prepared to accept the OEM and custom scanning tunneling microscopes with customer's own trade marks or brand names.

The McAllister Scanning Tunneling Microscope (STM) is designed as an add-on to existing UHV surface analysis systems. It comes mounted on an 8-inch OD conflat flange with integral vibration isolation, viewport, electrical and mechanical feedthroughs, "wobble stick" tip changer and optical microscope. It even has a sample manipulator attachment which allows samples to be changed in the microscope without any additional transfer devices. Samples can be moved to and from the microscope using only the standard XYZ manipulator. All other feedthroughs are integral with the 8-inch flange. A simple load lock allows rapid specimen introduction.
Self-contained STM subsystem mounts on one 8-inch port in any ultra-high vacuum surface analysis system. All electrical, mechanical and optical feedthroughs are integral to this flange.
Sample transfer allows modular sample holder to be completely removed from STM for preparation or analysis. Sample is located on the flange centerline parallel to the flange. It is compatible with commercial UHV systems using "off-axis" manipulators.

Modular tip holder design allows exchange of tips in vacuum. Reserve tips are conveniently stored on the microscope base plate. Damage to even several tips does not interrupt or delay STM operation.
The STM base plate clamps rigidly in place for tip exchange, sample transfer and coarse tip positioning. Vibration isolation is achieved by simply unclamping the base plate.
Beryllium-copper coil springs above stacked plates provide integral vibration isolation. No magnets are needed, so there are no magnetic fields to interfere with other instruments such as electron spectrometers.
All piezo ceramic elements are field-replaceable in case of accidental mechanical or electrical damage.
An optional, externaly mounted, optical binocular microscope, mirror and UHV compatible fiber-optic light pipe allow viewing during coarse sample approach to the tip to within 1 μm.
Patented automatic tip/sample approach uses the "scooter" method and is manufactured under license from University of Illinois.
Optional sample sled for sample holders that are heated.
Variable temperature (30-1000° K)
Surface preparation chamber w/ loadlock
In-situ processing gives this two-chamber UHV STM surface engineering along with surface science capability.

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